SE distribution for nominal cuts (F > F_th and mass bins 2–4). Differential distributions (ℕ(ℙ); top panel) and cumulative distributions (N(< ℙ); bottom panel, left axis) are shown for ℙ = log₁₀SE in the VS bin (solid and dot-dashed green lines), ICM region (double dot-dashed purple), field sampling (dotted red; pink-shaded 1σ dispersion), and VS excess (dashed blue). The bottom panel also shows the local significance, S(ℙ), of the VS excess (solid green curve, right axis).