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Table 2.
Number of voids per radial bin.
| Reff range [Mpc/h] | PINOCCHIO | OpenGADGET3 | |||
| Low res | High res | Low res | High res | Low res | High res |
| [12.08, 32.22] | [11.82, 31.47] | 285 | 277 | 271 | 265 |
| [32.22, 52.36] | [31.47, 51.13] | 270 | 267 | 267 | 277 |
| [52.36, 72.50] | [51.13, 70.78] | 39 | 55 | 41 | 47 |
Notes. The first column lists the bin edges for both low- and high-resolution runs, defined from the PINOCCHIOReff distribution. The second and third columns report the number of voids from the PINOCCHIO and OpenGADGET3 simulations, respectively, at redshift z = 0.
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