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Table 3.

Spectral features detected in the S region.

Line BB Ref. wavelength Det. wavelength Line flux Velocity
α (Å) (Å) (ph s−1 cm−2 × 10−5) (km s−1)
S XVI Lyα 12 4.7329 (a) 4.731 ± 0.003
S XVr 27 5.0386
S XVi 27 5.0666 (b) 0.14 ± 0.03 =v(Sxv r)
S XVf 27 5.1013 (b) =v(Sxv r)
S XIV 27 5.0858 5.081 ± 0.003 2.3 ± 0.8
S XI/Si XIV Lyβ(c) 27 5.2250 5.224 ± 0.002 −70 ± 140
S IX 2.7 5.3163
S II-VIII 27 5.3616 5.365 ± 0.003 200 ± 150
2.2
Si XIII Heβ 8 5.681 (d) 5.683 ± 0.003

Notes. For each feature we report the detection parameter α, the best-fit values (wavelength and line flux), and the Doppler velocities, computed using reference wavelengths measured by Hell et al. (2016). Line widths were fixed to 0.003 Å for all the lines. Hell et al. (2016) reports the statistical uncertainties for each energy, which correspond to an error in wavelength of the order of 10−4 − 10−5 Å. However, the authors state that there is also a systematic uncertainty of 0.23 eV for S lines, which results in an error on the wavelength of 0.0008 Å.

(b)

Distances between the r line and the i and f lines computed from Drake (1988).

(c)

The reference wavelength of Si XIV Lyβ is 5.217 Å (Erickson 1977).

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