Effect of individual indicators of assembly state on entropy profiles. Top: Spearman (partial) correlation coefficients of each indicator and profile values at each r/R_200m. Higher magnitudes (either positive or negative) indicate a greater influence of the value of the indicator on the profile value at this particular radius. Middle: Effect of selecting clusters based on each parameter on the location and depth of the steepest logarithmic slope of the entropy profile. The crosses correspond to the profile stacked over the one-third most relaxed subsample (according to the given indicator), while the filled dots correspond to the most disturbed third. Bottom panel: Similar to the middle panel, but with the location and height of the entropy peak. The blue regions in the middle and bottom panels indicate the 68% confidence region for the determination of the corresponding locations over each of the Δ_r-based subsamples (as an example), obtained by bootstrap resampling.