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Table 4.

Upper limits on hard X-ray excess.

Single source PSF fitting(a) Multiple source PSF fitting(b)
Source DET_ML Flux1 − 12 keV F1 − 12 keV/FBB DET_ML Flux1 − 12 keV F1 − 12 keV/FBB
[10−15 erg s−1 cm−2] [%] [10−15 erg s−1 cm−2] [%]
J0723 1.99 2.0 ± 1.0 0 . 55 0.28 + 0.28 $ 0.55^{+0.28}_{-0.28} $ 0 0.0 ± 0.5 0 . 0 0.14 + 0.14 $ 0.0^{+0.14}_{-0.14} $
J0819 0.07 0.7 ± 0.8 0 . 14 0.16 + 0.16 $ 0.14^{+0.16}_{-0.16} $ 0.07 0.7 ± 0.8 0 . 14 0.16 + 0.16 $ 0.14^{+0.16}_{-0.16} $
J0840 2.62 2.2 ± 1.0 0 . 44 0.21 + 0.21 $ 0.44^{+0.21}_{-0.21} $ 2.605 2.1 ± 1.0 0 . 42 0.21 + 0.21 $ 0.42^{+0.21}_{-0.21} $
J1347 0.60 1.3 ± 0.9 0 . 6 0.5 + 0.5 $ 0.6^{+0.5}_{-0.5} $ 0.537 1.2 ± 0.9 0 . 5 0.5 + 0.5 $ 0.5^{+0.5}_{-0.5} $
J1445 1516.55 117 ± 5 74 4 + 4 $ 74^{+4}_{-4} $ 1540.319 117 ± 5 74 4 + 4 $ 74^{+4}_{-4} $

Notes. Only photons between 1 keV and 12 keV are considered. Errors give 1σ confidence levels.

(a)

PSF fitting conducted at the position of the target, not accounting for any nearby sources.

(b)

All nearby field sources (within 1′) included in the PSF fitting at the position of the candidates. Field sources are identified based on the results from a previous edetect_stack run.

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